電源上電順序分析
Power-Up Sequence Analysis

現代電子系統整合了各式晶片與模組，其初始化與運作過程可能相互干擾。電源上電順序測試可確保來自不同電路模組的訊號遵循正確的時序，藉此避免衝突並確保系統穩定性。例如，通訊系統中若上電順序不當，可能導致數據傳輸錯誤。隨著電路複雜度提升，上電測試的挑戰也日益增加。
SDS5000X HD 示波器能在單次擷取中捕捉所有相關訊號的完整上電過程，大幅減少量測時間、提升效率，並降低因重複測試而產生的誤差。針對具備 8 組電源軌 (Power Rails) 的複雜電路，此功能更可實現「一次性」的精準量測。

Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000X HD captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements.

三相功率分析
Three-Phase Power Analysis

使用 8 通道示波器進行三相功率分析，可同時連接所有相位，同步量測三相電壓與電流訊號，精確即時地擷取波形與參數。使用者能直接觀察並比較相位關係，確保系統平衡。透過快速傅立葉轉換 (FFT) 功能，多通道示波器可對三相訊號執行諧波分析。選配的三相分析軟體則支援馬達向量圖測試、電能品質評估、紋波分析與效率評估。

Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation. 

寬能隙半導體測試解決方案
Complete Wide Bandgap Semiconductor Testing Solution

隨著 SIGLENT 最新 8 通道示波器與光隔離探棒的推出，補齊了寬能隙半導體測試的最後一塊拼圖。SDS5000X HD 具備皮秒 (ps) 等級的上升時間，能精準捕捉碳化矽 (SiC) 與氮化鎵 (GaN) 元件的快速切換波形。透過分析切換過程中的暫態電壓與電流變化，以及過衝 (Overshoot) 與振鈴 (Ringing) 等特性，協助工程師優化電路設計並確保訊號完整性。

The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000X HD achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity. 

基於 SDS5000L 的靈活多通道高速擷取系統
Flexible Multi-channel High-speed Acquisition System with the SDS5000L

SDS5000L 具備僅 1U 高度的輕薄外型，能輕鬆建構出靈活的多通道訊號擷取系統。透過 SYN64（64 通道同步分配器）提供低偏移 (Low-skew) 的同步觸發訊號，可將多台裝置串聯，建構出高達 512 通道的高速擷取系統。主機可透過 1000M LAN 存取各個單元。系統提供完整的 SCPI 指令集，以及 LabVIEW 與 IVI 驅動程式，便於進行數據擷取；LAN 介面並符合 LXI 標準。此外，透過 10 MHz 參考時鐘的「輸入 (In)」與「輸出 (Out)」進行菊花鏈 (Daisy chain) 串接，可確保測試系統中所有單元的取樣時鐘維持同步。

The SDS5000L features a compact form factor with a mere 1U height, enabling the construction of flexible multi-channel acquisition systems. Multiple units are combined to create a high-speed acquisition system with up to 512 channels by being triggered with low-skew synchronization signals from the 64-channel synchronization distributor SYN64 The host can access each unit over 1000M LAN. A complete SCPI command set as well as LabVIEW and IVI drivers are provided for easy data acquisition. The LAN port is LXI compliant. Sample clocks are synchronized between all units in the test system by cascading the 10 MHz In and 10 MHz Out clocks in a daisy chain.